Accelerated life testing of one-shot devices : data collection and analysis / Narayanaswamy Balakrishnan, McMaster University, Hamilton, Canada, Man Ho Ling, the Education University of Hong Kong, Tai Po, Hong Kong, Hon Yiu So, University of Waterloo, Waterloo, Canada.

Accelerated life testing of one-shot devices : data collection and analysis /

"A one-shot device is a unit that performs its function only once and cannot be used for testing more than once. Examples include electric explosive devices, fire extinguishers, airbags in cars, and missiles. While testing one-shot devices, only the condition of the device at a specific inspect...

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Bibliographic Details
Main Authors: Balakrishnan, N., 1956- (Author), Ling, Man Ho (Author), So, Hon Yiu (Author)
Format: Electronic eBook
Language:English
Published: Hoboken, NJ, USA : Wiley, 2021.
Edition:First edition.
Subjects:
Accelerated life testing.
Failure analysis (Engineering)
Equipment Failure Analysis
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