Testing Complex and Embedded Systems / by Kim H. Pries and Jon M. Quigley.

Testing Complex and Embedded Systems /

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Many enterprises regard system-level testing as the final piece of the development effort, rather than as a tool that should be integrated throughout the development process. As a consequence, test teams often execute critical test plans just before product launch, resulting in much of the correctiv...

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Bibliographic Details
Main Authors: Pries, Kim H. (Author), Quigley, Jon M. (Author)
Corporate Author: Taylor and Francis
Format: Electronic eBook
Language:English
Published: Boca Raton, FL : CRC Press, [2018]
Edition:First edition.
Subjects:
Embedded computer systems > Testing.
Computers > Software Development & Engineering > General.
Computers > Hardware > Personal Computers > General.
Computers > Hardware > Handheld Devices.
Computers > Microprocessors.
Electronic books.
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