An introduction to mixed-signal IC test and measurement Gordon Roberts, Friedrich Taenzler, Mark Burns.

An introduction to mixed-signal IC test and measurement

"With the proliferation of complex semiconductor devices containing digital, analog, mixed-signal and radio-frequency circuits, the economics of test has come to the forefront and today's engineer needs to be fluent in all four circuit types. Having access to a book that covers these topic...

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Bibliographic Details
Main Author: Roberts, Gordon W., 1959-
Corporate Author: Knovel (Firm)
Other Authors: Taenzler, Friedrich, Burns, Mark, 1962-
Format: Electronic eBook
Language:English
Published: New York : Oxford University Press, [2012]
Edition:2nd ed.
Series:Oxford series in electrical and computer engineering.
Subjects:
Integrated circuits > Testing.
Mixed signal circuits > Testing.
Electronic books.
Online Access: Full text (Wentworth users only)
Table of Contents:
  • Overview of mixed-signal testing
  • Tester hardware
  • DC and parametric measurements
  • Data analysis and probability theory
  • Yield, measurement accuracy, and test time
  • DAC testing
  • ADC testing
  • Sampling theory
  • DSP-based testing
  • Analog channel testing
  • Sampled channel testing
  • Fundamentals of RF testing
  • RF test methods
  • Clock and serial data communications channel measurements
  • Tester interfacing--DIB design
  • Design for test (DfT).

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