An introduction to mixed-signal IC test and measurement

"With the proliferation of complex semiconductor devices containing digital, analog, mixed-signal and radio-frequency circuits, the economics of test has come to the forefront and today's engineer needs to be fluent in all four circuit types. Having access to a book that covers these topic...

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Bibliographic Details
Main Author: Roberts, Gordon W., 1959-
Corporate Author: Knovel (Firm)
Other Authors: Taenzler, Friedrich, Burns, Mark, 1962-
Format: Electronic eBook
Language:English
Published: New York : Oxford University Press, [2012]
Edition:2nd ed.
Series:Oxford series in electrical and computer engineering.
Subjects:
Online Access: Full text (Wentworth users only)