VLSI test principles and architectures : design for testability / edited by Laung-Terng Wang, Cheng-Wen Wu, Xiaoqing Wen.

VLSI test principles and architectures : design for testability /

Show other versions (1)

This book is a comprehensive guide to new DFT methods that will show the readers how to design a testable and quality product, drive down test cost, improve product quality and yield, and speed up time-to-market and time-to-volume. Most up-to-date coverage of design for testability. Coverage of indu...

Full description

Saved in:
Bibliographic Details
Other Authors: Wang, Laung-Terng (Editor), Wu, Cheng-Wen, EE Ph. D. (Editor), Wen, Xiaoqing (Editor)
Format: Electronic eBook
Language:English
Published: Amsterdam ; Boston : Elsevier Morgan Kaufmann Publishers, [2006]
Series:Morgan Kaufmann series in systems on silicon.
Subjects:
Integrated circuits > Very large scale integration > Testing.
Integrated circuits > Very large scale integration > Design.
Integrated circuits > Very large scale integration > Design and construction.
dissertations.
Academic theses.
Online Access: Full text (Wentworth users only)
Local Note:ProQuest Ebook Central

Internet

Full text (Wentworth users only)

Similar Items