VLSI test principles and architectures : design for testability /
This book is a comprehensive guide to new DFT methods that will show the readers how to design a testable and quality product, drive down test cost, improve product quality and yield, and speed up time-to-market and time-to-volume. Most up-to-date coverage of design for testability. Coverage of indu...
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Other Authors: | , , |
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Format: | Electronic eBook |
Language: | English |
Published: |
Amsterdam ; Boston :
Elsevier Morgan Kaufmann Publishers,
[2006]
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Series: | Morgan Kaufmann series in systems on silicon.
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Subjects: | |
Online Access: |
Full text (Wentworth users only) |
Local Note: | ProQuest Ebook Central |