Radiation effects and soft errors in integrated circuits and electronic devices / editors, R.D. Schrimpf, D.M. Fleetwood.

Radiation effects and soft errors in integrated circuits and electronic devices /

This book provides a detailed treatment of radiation effects in electronic devices, including effects at the material, device, and circuit levels. The emphasis is on transient effects caused by single ionizing particles (single-event effects and soft errors) and effects produced by the cumulative en...

Full description

Saved in:
Bibliographic Details
Other Authors: Schrimpf, Ronald Donald, Fleetwood, D. M. (Dan M.)
Format: Electronic eBook
Language:English
Published: Singapore ; New Jersey : World Scientific Pub., ©2004.
Series:Selected topics in electronics and systems ; vol. 34.
Subjects:
Electronic circuits > Effect of radiation on.
Integrated circuits > Effect of radiation on.
Online Access: Full text (Wentworth users only)
Local Note:ProQuest Ebook Central

Internet

Full text (Wentworth users only)

Similar Items