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  1. 61
    Wafer-Level Testing and Test During Burn-In for Integrated Circuits.

    Wafer-Level Testing and Test During Burn-In for Integrated Circuits. by Bahukudumbi, Sudarshan

    Published 2010
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  2. 62
    Mechanical stress on the nanoscale : simulation, material systems and characterization techniques / edited by Margrit Hanbücken, Pierre Muller, Ralf B. Wehrspohn.

    Mechanical stress on the nanoscale : simulation, material systems and characterization techniques / edited by Margrit Hanbücken, Pierre Muller, Ralf B. Wehrspohn.

    Published 2011
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  3. 63
    Semiconductor Strain Metrology : Principles and Applications.

    Semiconductor Strain Metrology : Principles and Applications. by Wong, Terence K. S.

    Published 2012
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  4. 64
    Defects-recognition imaging and physics in semiconductors XIV : selected peer reviewed papers from the 14th international conference on defects-recognition, imaging and physics in semiconductors, September 25-29, 2011, Miyazaki, Japan / edited by Hiroshi Yamada-Kaneta and Akira Sakai.

    Defects-recognition imaging and physics in semiconductors XIV : selected peer reviewed papers from the 14th international conference on defects-recognition, imaging and physics in...

    Published 2012
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  5. 65
    Recent Topics on Modeling of Semiconductor Processes, Devices, and Circuits.

    Recent Topics on Modeling of Semiconductor Processes, Devices, and Circuits. by Topaloglu, Rasit Onur

    Published 2011
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  6. 66
    Electricity and electronics fundamentals / Dale R. Patrick, Stephen W. Fardo.

    Electricity and electronics fundamentals / Dale R. Patrick, Stephen W. Fardo. by Patrick, Dale R.

    Published 2008
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  7. 67
    Future trends in microelectronics. edited by Serge Luryi, Jimmy Xu, Alexander Zaslavsky.

    Future trends in microelectronics. edited by Serge Luryi, Jimmy Xu, Alexander Zaslavsky.

    Published 2016
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  8. 68
    Gettering and defect engineering in semiconductor technology XV / [edited by J.D. Murphy].

    Gettering and defect engineering in semiconductor technology XV / [edited by J.D. Murphy].

    Published 2014
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  9. 69
    Database Needs for Modeling and Simulation of Plasma Processing.

    Database Needs for Modeling and Simulation of Plasma Processing. by Staff, National Research Council

    Published 1996
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  10. 70
    MOCVD growth of GaN-based high electron mobility transistor structures / Jr-Tai Chen.

    MOCVD growth of GaN-based high electron mobility transistor structures / Jr-Tai Chen. by Chen, Jr-Tai

    Published 2015
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  11. 71
    Defects and Diffusion, Theory & Simulation II.

    Defects and Diffusion, Theory & Simulation II. by Fisher, David J.

    Published 2010
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  12. 72
    Semiconductor Nanowires. edited by Anna Fontcuberta I. Morral, Shadi A. Dayeh and Chennupati Jagadish.

    Semiconductor Nanowires. edited by Anna Fontcuberta I. Morral, Shadi A. Dayeh and Chennupati Jagadish.

    Published 2015
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  13. 73
    SiC materials and devices. edited by Michael Shur, Sergey Rumyantsev, Michael Levinshtein.

    SiC materials and devices. edited by Michael Shur, Sergey Rumyantsev, Michael Levinshtein.

    Published 2006
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  14. 74
    CMOS RF modeling, characterization and applications / editors, M. Jamal Deen, Tor A. Fjeldly.

    CMOS RF modeling, characterization and applications / editors, M. Jamal Deen, Tor A. Fjeldly.

    Published 2002
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  15. 75
    Radiation Defect Engineering.

    Radiation Defect Engineering. by Vitali, Kozlovski

    Published 2005
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  16. 76
    Selected Semiconductor Research.

    Selected Semiconductor Research. by Li, Ming-Fu

    Published 2011
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  17. 77
    Makers of the microchip : a documentary history of Fairchild Semiconductor / Christophe Lécuyer, David C. Brock.

    Makers of the microchip : a documentary history of Fairchild Semiconductor / Christophe Lécuyer, David C. Brock. by Lécuyer, Christophe

    Published 2010
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  18. 78
    Handbook of cleaning for semiconductor manufacturing : fundamentals and applications / Karen A. Reinhardt, Richard F. Reidy.

    Handbook of cleaning for semiconductor manufacturing : fundamentals and applications / Karen A. Reinhardt, Richard F. Reidy. by Reinhardt, Karen A.

    Published 2011
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  19. 79
    Handbook of Wafer Bonding.

    Handbook of Wafer Bonding. by Ramm, Peter

    Published 2011
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  20. 80
    HeteroSiC & WASMPE 2011 : selected, peer reviewed papers from the 4th Workshop on Advanced Semiconductor Materials and Devices for Power Electronics Applications (HeteroSiC & WASMPE 2011), June 27-30, 2011, Tours, France / edited by Daniel Alquier.

    HeteroSiC & WASMPE 2011 : selected, peer reviewed papers from the 4th Workshop on Advanced Semiconductor Materials and Devices for Power Electronics Applications (HeteroSiC & WASMP...

    Published 2012
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