Properties of amorphous silicon and its alloys

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Bibliographic Details
Corporate Authors: INSPEC (Information service), Knovel (Firm)
Other Authors: Searle, Tim
Format: Electronic eBook
Language:English
Published: London : IEE : INSPEC, [1998]
Series:EMIS datareviews series ; no. 19.
Subjects:
Online Access: Full text (Wentworth users only)
Description
Physical Description:xiv, 412 pages : illustrations ; 29 cm.
Bibliography:Includes bibliographical references and index.
ISBN:1591248760 (electronic bk.)
Reproduction Note:Electronic reproduction.