|
|
|
|
| LEADER |
00000cam a2200000ua 4500 |
| 001 |
w728956 |
| 005 |
20231012114642.0 |
| 006 |
m d |
| 007 |
cr cn- |
| 008 |
030916t19931993maua sb 001 0 eng d |
| 020 |
|
|
|a 1591245257 (electronic bk.)
|
| 035 |
|
|
|a (OCoLC)53032668
|
| 035 |
|
|
|a (OCoLC)ocm53032668
|
| 040 |
|
|
|a KNOVL
|c KNOVL
|d WEN
|d UtOrBLW
|
| 049 |
|
|
|a WENN
|
| 050 |
1 |
4 |
|a QC611.8.S5
|b C48 1993eb
|
| 245 |
0 |
0 |
|a Characterization in silicon processing
|h [electronic resource] /
|c editor, Yale Strusser ; consulting editors, C.R. Brundle, Gary E. McGuire ; managing editor, Lee E. Fitzpatrick.
|
| 264 |
|
1 |
|a Boston :
|b Butterworth-Heinemann ;
|a Greenwich :
|b Manning,
|c [1993]
|
| 264 |
|
4 |
|c ©1993
|
| 300 |
|
|
|a xiii, 240 pages :
|b illustrations ;
|c 25 cm.
|
| 336 |
|
|
|a text
|b txt
|2 rdacontent
|
| 337 |
|
|
|a computer
|b c
|2 rdamedia
|
| 338 |
|
|
|a online resource
|b cr
|2 rdacarrier
|
| 490 |
1 |
|
|a Materials characterization series
|
| 504 |
|
|
|a Includes bibliographical references and index.
|
| 533 |
|
|
|a Electronic reproduction.
|b Norwich, N.Y. :
|c Knovel,
|d 2003.
|n System requirements: Adobe Acrobat Reader.
|n Available via the World Wide Web.
|n Access restricted to users at licensed institutions.
|n Includes interactive index.
|
| 650 |
|
0 |
|a Silicon.
|0 sh 85122512
|
| 650 |
|
0 |
|a Electric conductors.
|0 sh 85041622
|
| 650 |
|
0 |
|a Semiconductor films.
|0 sh 85119892
|
| 650 |
|
0 |
|a Surface chemistry.
|0 sh 85130718
|
| 700 |
1 |
|
|a Strausser, Yale.
|0 n 93044462
|
| 710 |
2 |
|
|a Knovel (Firm)
|0 nr2001027264
|
| 776 |
1 |
|
|c Original
|z 0750691727
|
| 830 |
|
0 |
|a Materials characterization series.
|0 n 92039072
|
| 951 |
|
|
|a 728956
|
| 999 |
f |
f |
|i 78174562-0947-5a3f-8cba-3a65e5129232
|s daeb8f1a-d0d3-5281-8848-0f8cb4f5f45a
|t 0
|
| 952 |
f |
f |
|a Wentworth Institute of Technology
|b Main Campus
|c Wentworth Library
|d Ebooks
|t 0
|e Knovel
|h Other scheme
|
| 856 |
4 |
0 |
|t 0
|u https://ezproxywit.flo.org/login?qurl=https://app.knovel.com/hotlink/toc/id:kpCSP00001/characterization-in-silicon
|y Full text (Wentworth users only)
|
Wentworth
Institute of Technology