An introduction to surface analysis by XPS and AES /

"This accessible second edition of the bestselling book, An Introduction to Surface Analysis by XPS and AES, 2nd Edition explores the basic principles and applications of X-ray Photoelectron Spectroscopy (XPS) and Auger Electron Spectroscopy (AES) techniques. It starts with an examination of th...

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Bibliographic Details
Main Authors: Watts, John F. (Author), Wolstenholme, John (Author)
Format: Electronic eBook
Language:English
Published: Hoboken, NJ : Wiley, [2019]
Edition:Second edition.
Subjects:
Online Access: Full text (Wentworth users only)
Description
Summary:"This accessible second edition of the bestselling book, An Introduction to Surface Analysis by XPS and AES, 2nd Edition explores the basic principles and applications of X-ray Photoelectron Spectroscopy (XPS) and Auger Electron Spectroscopy (AES) techniques. It starts with an examination of the basic concepts of electron spectroscopy and electron spectrometer design, followed by a qualitative and quantitative interpretation of the electron spectrum."--
"The year of publication (2019) is the Golden Jubilee of the launch of XPS and AES as commercially available analysis methods. It is a rather salutary though that both of us have been involved with applied surface analysis for more than three quarters of this time, which gives us both cause to reflect on the many innovations that have taken place during this time. As a celebration of 50 years of XPS we include images of one of the first commercial XPS systems and a sectioned analyser from such a system, overleaf"--
Physical Description:1 online resource : illustrations
Bibliography:Includes bibliographical references and index.
ISBN:9781119417644
1119417643
9781119417620
1119417627
9781119417651
1119417651
Source of Description, Etc. Note:Print version record and online resource (Wiley, viewed November 8, 2022).