Testing of Software and Communicating Systems 20th IFIP TC 6/WG 6.1 International Conference, TestCom 2008 8th International Workshop, FATES 2008 Tokyo, Japan, June 10-13, 2008 Proceedings / edited by Kenji Suzuki, Teruo Higashino, Andreas Ulrich, Toru Hasegawa.

Testing of Software and Communicating Systems 20th IFIP TC 6/WG 6.1 International Conference, TestCom 2008 8th International Workshop, FATES 2008 Tokyo, Japan, June 10-13, 2008 Proceedings /

This book constitutes the refereed proceedings of the 20th IFIP TC 6/WG 6.1 International Conference on Testing Communicating Systems, TestCom 2008, and the 8th International Workshop on Formal Approaches to Testing of Software, FATES 2008, jointly held in Tokyo, Japan, in June 2008. The 18 revised...

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Bibliographic Details
Main Author: Suzuki, K. (Kenji)
Corporate Author: SpringerLink (Online service)
Other Authors: Higashino, Teruo, Ulrich, Andreas, Hasegawa, Toru
Format: Electronic eBook
Language:English
Published: Berlin, Heidelberg : Springer Berlin Heidelberg, 2008.
Series:Lecture notes in computer science ; 5047.
Subjects:
Computer science.
Computer networks.
Software engineering.
Logic design.
Information storage and retrieval systems.
Telecommunication.
Online Access: Full text (Wentworth users only).
Description
Summary:This book constitutes the refereed proceedings of the 20th IFIP TC 6/WG 6.1 International Conference on Testing Communicating Systems, TestCom 2008, and the 8th International Workshop on Formal Approaches to Testing of Software, FATES 2008, jointly held in Tokyo, Japan, in June 2008. The 18 revised full papers presented together with 2 invited talks were carefully reviewed and selected from initially 58 submissions to both events. The papers cover new approaches, concepts, theories, methodologies, tools, and experiences in the field of testing of communicating systems and general software. They are organized in topical sections on general software testing, testing continuous and real-time systems, network testing, test generation, concurrent system testing, and applications of testing.
Physical Description:digital.
ISBN:9783540685241
ISSN:0302-9743 ;
DOI:10.1007/978-3-540-68524-1

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