Test and diagnosis of analogue, mixed-signal and RF integrated circuits the system on chip approach /

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Bibliographic Details
Corporate Authors:	Institution of Engineering and Technology, Knovel (Firm)
Other Authors:	Sun, Yichuang
Format:	Electronic eBook
Language:	English
Published:	London : Institution of Engineering and Technology, 2008.
Series:	IET circuits, devices and systems series ; 19.
Subjects:	Linear integrated circuits > Testing. Mixed signal circuits > Testing. Radio frequency integrated circuits > Testing. Electronic books.
Online Access:	Full text (Wentworth users only)

Test and diagnosis of analogue, mixed-signal and RF integrated circuits : the system on chip approach / edited by Yichuang Sun.

Published 2008

Full text (Wentworth users only)

Electronic eBook