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100520s2008 enka sb 001 0 eng d |
| 020 |
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|a 9781615833153 (electronic bk.)
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| 020 |
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|a 1615833153 (electronic bk.)
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| 035 |
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|a (OCoLC)623468726
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| 037 |
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|b Knovel Corporation
|n http://www.knovel.com
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|a KNOVL
|c KNOVL
|d WEN
|d UtOrBLW
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|a WENN
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|a TK7874.654
|b .T48 2008eb
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|a 621.38150287
|2 22
|
| 245 |
0 |
0 |
|a Test and diagnosis of analogue, mixed-signal and RF integrated circuits
|h [electronic resource] :
|b the system on chip approach /
|c edited by Yichuang Sun.
|
| 264 |
|
1 |
|a London :
|b Institution of Engineering and Technology,
|c 2008.
|
| 300 |
|
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|a xx, 389 pages :
|b illustrations ;
|c 24 cm.
|
| 336 |
|
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|a text
|b txt
|2 rdacontent
|
| 337 |
|
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|a computer
|b c
|2 rdamedia
|
| 338 |
|
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|a online resource
|b cr
|2 rdacarrier
|
| 490 |
1 |
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|a Circuits, devices and systems series ;
|v 19
|
| 504 |
|
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|a Includes bibliographical references and index.
|
| 533 |
|
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|a Electronic reproduction.
|b Norwich, N.Y. :
|c Knovel,
|d 2010.
|n System requirements: Adobe Acrobat Reader.
|n Available via the World Wide Web.
|n Access restricted to users at licensed institutions.
|n Includes interactive index.
|
| 650 |
|
0 |
|a Linear integrated circuits
|x Testing.
|0 sh 85077176
|
| 650 |
|
0 |
|a Mixed signal circuits
|x Testing.
|0 sh 97004864
|
| 650 |
|
0 |
|a Radio frequency integrated circuits
|x Testing.
|0 sh2003001294
|
| 655 |
|
4 |
|a Electronic books.
|
| 700 |
1 |
|
|a Sun, Yichuang.
|0 n 98087876
|
| 710 |
2 |
|
|a Institution of Engineering and Technology.
|0 no2006040878
|
| 710 |
2 |
|
|a Knovel (Firm)
|0 nr2001027264
|
| 776 |
1 |
|
|c Original
|z 9780863417450
|w (OCoLC)180473599
|
| 830 |
|
0 |
|a IET circuits, devices and systems series ;
|v 19.
|0 no2007029683
|
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|
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|a Wentworth Institute of Technology
|b Main Campus
|c Wentworth Library
|d Ebooks
|t 0
|e Knovel
|h Other scheme
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|u https://ezproxywit.flo.org/login?qurl=https://app.knovel.com/web/toc.v/cid:kpTDAMSRF1
|y Full text (Wentworth users only)
|
Wentworth
Institute of Technology