Auger electron spectroscopy : practical application to materials analysis and characterization of surfaces, interfaces, and thin films /

Auger electron spectroscopy (AES) is capable of providing elemental composition and, in some restricted cases, chemical bonding information for the elements present near the surface of solid materials. The surface specificity of this technique is such that only atoms in the top 5 to 10 nm are detect...

Full description

Saved in:
Bibliographic Details
Main Author: Wolstenholme, John (Author)
Format: Electronic eBook
Language:English
Published: New York [New York] (222 East 46th Street, New York, NY 10017) : Momentum Press, 2015.
Series:Materials characterization and analysis collection.
Subjects:
Online Access: Full text (Wentworth users only)
Local Note:ProQuest Ebook Central
Table of Contents:
  • 1. Introduction
  • 2. The interaction of electrons with solid materials
  • 3. AES methodologies
  • 4. Instrumentation for auger analysis
  • 5. Auger electron spectroscopy in materials analysis
  • 6. Analytical methods for the characterization of materials
  • Appendix 1. Abbreviations and acronyms
  • Appendix 2. Quantum numbers
  • Appendix 3. Comparison of surface and thin film analysis techniques
  • Appendix 4. Standardization in surface analysis
  • Appendix 5. Sources of the figures
  • Further reading
  • Index.