On-Wafer Calibration Techniques Enabling Accurate Characterization of High-Performance Silicon Devices at the Mm-Wave Range

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Bibliographic Details
Main Author:	Rumiantsev, Andrej
Format:	Electronic eBook
Language:	English
Published:	Aalborg : River Publishers, 2019.
Series:	River Publishers Series in Electronic Materials and Devices Ser.
Subjects:	Semiconductors > Characterization.
Online Access:	Full text (Wentworth users only)
Local Note:	ProQuest Ebook Central

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Full text (Wentworth users only)